MOSFET Test Solutions 4-Station TMTT Dual-Die Test System (APT6004)
UPH:55K (Test Time=13mS Index Time=50mS)
Built-in oscilloscope
Expandable matrix supports 8-pin
device testing
Parallel testing architecture significantly
improves efficiency and reduces test cost
Device Categories:
Diode, MOSFET, Photo Couple, Transistor
Specifications
Small-Signal Device Test System
- HV Source: 1V - 600V/ 1uA~10mA
- Leakage Measure: 10pA~10mA
- HV Measure: 1V - 600V
- HC Source: 1uA - 5A
- HC Measure: 1uA~5A
Related Application
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