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MOSFET Test Solutions 4-Station TMTT Dual-Die Test System (PER8020MD)

Part No. PER8020MD
Compliant with MIL-STD-750C, Method 3470 Oscilloscope connection supported for observing test waveforms Compatible with TMTT handler Compatible with MOSFET switch box for diode testing(MOSFET provided by user)

Specifications

  • UIS Tester (Unclamped Inductive Load Tester)

  • Voltage Output (VD): 40V ~ 2500V

  • Current Output (IP): 1 ~ 100A

  • Gate Voltage (VGS): -20V ~ +20V

  • DC Power Supply (VDD): 150V / 5A

  • td (Pulse Width): 20 µs ~ 500 µs

  • External Inductor Box (Optional): 10 µH to 159.9 mH

Download attachment

File nameFile Description
IC-Testing-1.pdf
Download attachment

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MOSFET Test Solutions 4-Station TMTT Dual-Die Test System (PER8020MD)