MOSFET Test Solutions 4-Station TMTT Dual-Die Test System (PFET8200G)
Part No. PFET8200G
Supports measurement GaN and SiC device
Low on-resistance measurement
User-programmable test process
Optional curving software for BVDSS, IDSS, IGSSF
plotting
Device Categories:
Diode , MOSFET, IGBT, Transistor
Specifications
Basic Semiconductor Electrical Testing
Voltage Output: 1V - 2000V
Current Measurement: 1nA - 10mA
Current Output: 1uA - 200A
Voltage Measurement: 1Mv - 2000V
Max VGS: ±30V
Related Application
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